Soft Error Mitigation Library

A soft error is a "glitch" in a semiconductor device. These glitches are random, usually not catastrophic, and normally do not destroy the device. Soft errors are caused by a charged particle which can come directly from radioactive materials and cosmic rays or indirectly because of high-energy particle interaction with the semiconductor itself. Hence, these are outside of the designer's control.

A leading U.S. based inventor of the FPGA, hardware programmable SoCs, and the ACAP, designed to deliver the most dynamic video codec unit capable of handling video streaming, conferencing, broadcasting, surveillance, vision, web multimedia, video distribution & recording products & services.

Softnautics played a significant role in developing the Soft Error Mitigation (SEM) Library to perform SEU detection, correction, and classification for configuration memory. The error injection feature provides a means to evaluate and test the SEU mitigation capabilities of the IP cores without the need for expensive test time at a radiation effects facility.

Business Benefits

Semiconductor

80% memory footprint optimization

Semiconductor

63% increased performance in NPI Scan including complex hardware designs

Semiconductor

95% increased performance in CRAM Scan to detect bit flip errors

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